发明名称 |
X-RAY FLUORESCENCE ANALYSIS OF MULTILAYERED SAMPLES |
摘要 |
<p>The invention refers to a device for measurement of the thickness of a first layer, comprising one or more sublayers, on a second layer of a metal sheet by X-ray fluorescence analysis comprising means for generating and directing a beam of polychromatic primary X-rays, said beam being able to penetrate into the first and second layers for converting primary X-rays into chemical element specific fluorescent X-rays by means of absorption of primary X-rays and re-emission of fluorescent X-rays by the chemical element, and further comprising means for detecting element specific fluorescent X-rays and determining an intensity thereof. The means for detection have been placed at an angle with respect to the primary beam of X-rays in dependence of the chemical element from which the fluorescent X-rays are to be detected. Herewith an improvement of the efficiency of detection is achieved, and the measurement time is reduced accordingly. Hence, a device is provided with which alloys with a low concentration of fluorescent elements can now be analysed, for determining the thickness of a cladding. <IMAGE></p> |
申请公布号 |
EP1206679(B1) |
申请公布日期 |
2003.07.02 |
申请号 |
EP20000949483 |
申请日期 |
2000.08.10 |
申请人 |
CORUS ALUMINIUM WALZPRODUKTE GMBH |
发明人 |
HASZLER, ALFRED, JOHANN, PETER;GHAZIARY, HORMOZ |
分类号 |
G01B15/02;G01N23/223;(IPC1-7):G01B15/02 |
主分类号 |
G01B15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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