发明名称 CHECK STRUCTURE FOR SEMICONDUCTOR DEVICE IN CONTROLLER
摘要 PROBLEM TO BE SOLVED: To provide a check structure with which whether or not a semiconductor device inside a substrate box is illegally exchanged can be easily confirmed in a short period of time. SOLUTION: In a controller 1 composed of a substrate box 2, a circuit board 3 fixed in the substrate box 2 and a semiconductor device 7 mounted on the circuit board 3 via a semiconductor socket 8, a hole 10 is opened on the circuit board 3 while facing the rear side of the semiconductor socket 8, and further, the substrate box 2 is provided with a window hole 11 for confirming the rear side of the semiconductor socket 8 or semiconductor device 7 via the hole 10. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003181107(A) 申请公布日期 2003.07.02
申请号 JP20020333138 申请日期 2002.11.18
申请人 SANYO PRODUCT CO LTD 发明人 OKAMURA GEN
分类号 A63F7/02;(IPC1-7):A63F7/02 主分类号 A63F7/02
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