发明名称 |
ANGLE AND GAP ADJUSTABLE NOZZLE APPARATUS FOR TEBR OF SEMICONDUCTOR WAFER |
摘要 |
PURPOSE: An angle and gap adjustable nozzle apparatus for TEBR(Topside Edge Bead Removing) of semiconductor wafer is provided to be capable of actively coping with the problems generated in a process by adjusting the angle and height of a rinse solution jetting nozzle. CONSTITUTION: A bracket(30) is connected to one side of a column(23). A rotating part(40) is connected with the end portion of the bracket(30) using a hinge shaft(32). A guiding hole(33) is formed in the end portion of the bracket(30). A controlling shaft(34) is capable of fixing the rotating part(40) through the guiding hole(33). A fixing and loosing part is capable of fixing and moving a rinse solution jetting nozzle(22) at one side of the rotating part(40).
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申请公布号 |
KR20030053956(A) |
申请公布日期 |
2003.07.02 |
申请号 |
KR20010084003 |
申请日期 |
2001.12.24 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
LEE, SEUNG HO;LEE, SU HYEONG |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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