发明名称 TEMPERATURE CONTROLLING APPARATUS
摘要 PROBLEM TO BE SOLVED: To realize a temperature pattern in a plane containing microscopic heating regions and cooling regions. SOLUTION: The temperature controlling apparatus 100 is provided with a semiconductor substrate 200, a heating means containing a plurality of impurity diffused region units 300 formed on one surface of the substrate 200 by the selective diffusion of impurities and a cooling part 400 to cool the substrate through the back surface of the substrate. The temperature-controlled object 10 contacting with the heating surface of the substrate 200 is selectively heated by heating the heating regions corresponding to the shape of the impurity diffused region units selectively energized among the plural impurity diffused region units 300 and cooled through the substrate 200 cooled by the cooling part 400 at regions other than the heating regions. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003180328(A) 申请公布日期 2003.07.02
申请号 JP20010390547 申请日期 2001.12.21
申请人 TERUMO CORP 发明人 KUDO TAKESHI
分类号 C12M1/00;(IPC1-7):C12M1/00 主分类号 C12M1/00
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