发明名称 Method for measuring powder x-ray diffraction data using one- or two-dimensional detector
摘要 High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray detection units (pixels) in order to measure data for interpolation between pixels and the obtained interpolating data are put together to thereby improve the spatial resolution in measurement that has been limited by the detection unit in the detector. <IMAGE>
申请公布号 EP1310786(A3) 申请公布日期 2003.07.02
申请号 EP20020025043 申请日期 2002.11.11
申请人 JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE;RIGAKU CORPORATION;RIKEN 发明人 TAKATA, MASAKI;NISHIBORI, EIJI;SAKATA, MAKOTO;HARADA, JIMPEI
分类号 G01N23/205;G01N23/207;G01T1/18;G01T1/24;G21K4/00 主分类号 G01N23/205
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