| 摘要 |
PURPOSE: A parallel mount test board for semiconductor memory device is provided to prevent an operation error of a multi-bank and a damage of a socket by using a reference slot and an extension slot. CONSTITUTION: A parallel mount test board includes an extension slot(35), a reference slot(34), and a plurality of parallel test slots(36,38). The parallel test slots(36,38) are connected with the extension slot(35) and the reference slot(34) in parallel. A plurality of memory elements are inserted into the extension slot(35), the reference slot(34), and the parallel test slots(36,38). Read/write operations are performed in the parallel test slots(36,38) when the read/write operation is performed in the reference slot(34). The reference slot(34) and the parallel test slots(36,38) are influenced by timing twisted by the extension slot(35).
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