THERMAL EMISSION DEVICE HAVING LIF MIXED WITH MG, CU, NA AND SI FOR MEASURING X-RAY AND METHOD FOR FABRICATING THE SAME

摘要

PURPOSE: A thermal emission device for measuring X-ray and a method for manufacturing the same are provided to achieve a superior performance of the thermal emission device by compressing, sintering, cooling and heat-treating LiF-based thermal emission material. CONSTITUTION: A thermal emission device fabricating method includes a step of compressing LiF-based thermal emission material, which is obtained by adding 0.35 to 0.12 mol% of Mg compound, 0.08 to 0.001 mol% of Cu compound, 1.3 to 0.5 mol% of Na compound, and 1.3 to 0.5 mol% of Si compound to LiF. Then, the LiF-based thermal emission material is subject to a sintering process at a temperature about 240 to 290 deg.C under a nitrogen atmosphere. Sintered LiF-based thermal emission material is cooled for a predetermined time. Then, the LiF-based thermal emission material is subject to a heat-treatment process at the temperature about 240 to 290 deg.C.