发明名称 METHOD FOR FORMING FLASH MEMORY CELL
摘要 PURPOSE: A method for forming a flash memory cell is provided to be capable of forming a dielectric film having uniform thickness on a floating gate. CONSTITUTION: A floating gate(204) made of a doped polysilicon layer is formed on a semiconductor substrate(200). By tilt-implanting of nitrogen or argon ions into the floating gate(204), the surface of the polysilicon layer is changed to amorphous silicon layer(206). Then, a dielectric film and a control gate are sequentially formed on the entire surface of the resultant structure. At the time, the tilt angle in the ion-implantation processing is about 45 degree.
申请公布号 KR20030053555(A) 申请公布日期 2003.07.02
申请号 KR20010083308 申请日期 2001.12.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, HYEON YONG;LEE, JONG GON
分类号 H01L27/115;(IPC1-7):H01L27/115 主分类号 H01L27/115
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