发明名称 |
METHOD FOR FORMING FLASH MEMORY CELL |
摘要 |
PURPOSE: A method for forming a flash memory cell is provided to be capable of forming a dielectric film having uniform thickness on a floating gate. CONSTITUTION: A floating gate(204) made of a doped polysilicon layer is formed on a semiconductor substrate(200). By tilt-implanting of nitrogen or argon ions into the floating gate(204), the surface of the polysilicon layer is changed to amorphous silicon layer(206). Then, a dielectric film and a control gate are sequentially formed on the entire surface of the resultant structure. At the time, the tilt angle in the ion-implantation processing is about 45 degree.
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申请公布号 |
KR20030053555(A) |
申请公布日期 |
2003.07.02 |
申请号 |
KR20010083308 |
申请日期 |
2001.12.22 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, HYEON YONG;LEE, JONG GON |
分类号 |
H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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