发明名称 METHOD FOR FABRICATING IMAGE SENSOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating an image sensor of a semiconductor device is provided to increase the area of a photo diode by forming simultaneously opening portions of a contact on an upper face and a side face of the photo diode in a contact forming process. CONSTITUTION: A photo diode layer(13) is formed on an upper portion of a semiconductor substrate(11) including a shallow trench isolation layer(12). A dielectric layer(14) of a predetermined thickness is formed on an upper portion of the resultant. A contact is formed by etching partially the dielectric layer and the shallow trench isolation layer. A metal material is deposited on the resultant. A metal layer(15) is formed by patterning the metal material. The metal layer is used for connecting electrically the upper and side edge portion of the photo diode layer to a poly gate.
申请公布号 KR20030054788(A) 申请公布日期 2003.07.02
申请号 KR20010085198 申请日期 2001.12.26
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 JUN, IN GYUN;LEE, YONG GEUN
分类号 H01L27/146;(IPC1-7):H01L27/146 主分类号 H01L27/146
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