发明名称 METHOD FOR FORMING ALIGNMENT KEY OF METAL WIRING MASK
摘要 PURPOSE: A method for forming an alignment key of a metal wiring mask is provided to be capable of exactly aligning a via mask and the metal wiring mask while a metal film is over-polished. CONSTITUTION: An inter-metal dielectric(12) is formed on a lower metal line and planarized by CMP(Chemical Mechanical Polishing). An alignment key(14a) having topology is formed on the inter-metal dielectric. Via holes are formed in the inter-metal dielectric(12). A barrier metal film(18) and a metal film are sequentially filled into the via hole and planarized, thereby forming a plug(20). An upper metal line(22) is then formed on the plug. At this time, the alignment key(14a) is the same use in the step of forming the upper metal line(22).
申请公布号 KR20030054071(A) 申请公布日期 2003.07.02
申请号 KR20010084167 申请日期 2001.12.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, BONG CHEON
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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