发明名称 RF test set with concurrent measurement architecture
摘要 An RF test set having a concurrent measurement architecture is provided. The RF test set is adapted for testing an RF communications device such as a cellular phone according to a set of RF tests. An RF source and an RF receiver are used to communicate with the cellular phone in order to perform the call processing operations to control the cellular phone while performing parametric measurements according to the RF tests. Concurrent measurements allow operation of concurrent measurement processes and call processing operations to take place in the RF test set in order to decrease the time required for each RF test and to increase measurement throughput of the RF test set.
申请公布号 US6587671(B1) 申请公布日期 2003.07.01
申请号 US19990322505 申请日期 1999.05.28
申请人 AGILENT TECHNOLOGIES, INC. 发明人 KANAGO KERWIN D.;PLATT DAVID L.;SUMMERS JAMES B.;HUMPHERYS MELVIN D.;RYAN RICHARD P.;JOHNSON MATTHEW
分类号 H04W24/00;(IPC1-7):H04Q7/34 主分类号 H04W24/00
代理机构 代理人
主权项
地址