| 摘要 |
A timing correcting method for correcting the timings of an IC tester at low cost, wherein the method uses a probe (300) for taking out a signal fed to a pin out of the pins of an IC socket (203) to which an IC to be measured is plugged when the probe is brought into contact with the pin and supplying a correcting pulse to the pin, and the timing of the correcting pulse taken in by a reference comparator (CP-RF) provided in the probe and the timing of a reference correcting pulse applied to an IC socket from a reference driver (DR-RF) provided in the probe are measured by a timing measuring function that the IC tester has, thus performing timing correction.
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