发明名称 Swapped drain structures for electrostatic discharge protection
摘要 A method and apparatus for manufacturing an electrostatic discharge protection device. A first gate structure for the electrostatic device is formed. A first lightly doped drain and a second lightly doped drain for the electrostatic discharge protection device is formed. A second gate structure for a data path transistor is formed. A third lightly doped drain and a fourth lightly doped drain for a data path transistor is formed, wherein the first lightly doped drain and the second lightly doped drain have a higher doping level relative to the third lightly doped drain and the fourth lightly doped drain.
申请公布号 US6587322(B2) 申请公布日期 2003.07.01
申请号 US20010026186 申请日期 2001.12.20
申请人 LSI LOGIC CORPORATION 发明人 RANDAZZO TODD A.
分类号 H01L27/02;(IPC1-7):H02H9/00 主分类号 H01L27/02
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