发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a semiconductor device is provided to prevent a pattern defect of a photoresist layer by preventing reaction byproduct melted by developer from being attached to a semiconductor substrate. CONSTITUTION: A photoresist layer is coated on a semiconductor substrate(S1). An exposure process is performed on the photoresist layer through a photomask having a predetermined pattern(S3). Developer is sprayed on the photoresist layer while the semiconductor substrate rotates(S21). The semiconductor substrate stops rotating to make the developer rapidly penetrate into the photoresist layer. The first wet development process is performed on the photoresist layer while the semiconductor substrate is vibrated(S23). The semiconductor substrate stops rotating. The second wet development process is performed on the photoresist layer while the semiconductor substrate is stably maintained(S25). A cleaning process using deionized water is performed on the semiconductor substrate(S29).
申请公布号 KR20030053358(A) 申请公布日期 2003.06.28
申请号 KR20010083537 申请日期 2001.12.22
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 BAEK, SEUNG WON
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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