CELL SUBSTITUTION CIRCUIT FOR SUBSTITUTING DEFECT CELL WITH NORMAL CELL IN SEMICONDUCTOR MEMORY MODULE AND SEMICONDUCTOR MEMORY MODULE USING THE SAME

摘要

PURPOSE: A cell substitution circuit for substituting a defect cell with a normal cell in a semiconductor memory module and a semiconductor memory module using the same are provided to recover a bad unit chip by performing selectively an anti-fuse programming operation for the bad unit chip. CONSTITUTION: A cell substitution circuit(202) is used for substituting a defect cell with a normal cell in a semiconductor memory module which is formed with a plurality of packages. The cell substitution circuit includes a defect recovery address storage portion(204) and a fuse portion(206). The defect recovery address storage portion receives and stores a defect recovery address through a dedicated pin of a corresponding package from the outside. The fuse portion substitutes the defect cell with the normal cell by using the defect recovery address of the defect recovery address storage portion.