发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To simplify a process for removing scum and a residual organic constituent that are generated when a desired contact hole is formed by allowing an interlayer dielectric formed on a semiconductor substrate to be subjected to wet etching. SOLUTION: In the manufacturing method of a semiconductor device, when an interlayer dielectric 2 formed on a semiconductor substrate 1 is subjected to wet etching to forma a desired contact hole, a process is provided as the preprocess of the wet etching process. In the process, the surface of the interlayer dielectric 2 is washed by ozone water having a concentration of approximately 20 to 60 ppm, and scum and residual organic constituent are removed. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003179039(A) 申请公布日期 2003.06.27
申请号 JP20010377136 申请日期 2001.12.11
申请人 SANYO ELECTRIC CO LTD 发明人 MITSUSAKA EIICHI
分类号 G03F7/40;H01L21/027;H01L21/304;H01L21/308;H01L21/768;(IPC1-7):H01L21/308 主分类号 G03F7/40
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