发明名称 PREPARING METHOD OF SILICON CARBIDE SINGLE CRYSTAL SURFACE OXIDE FILM USING ULTRA-HIGH TEMPERATURE WATER VAPOR
摘要 PROBLEM TO BE SOLVED: To provide a method for oxidizing the surface of a silicon carbide single crystal in a water vapor atmosphere especially exceeding 1200°C for a method for preparing the semiconductor device of metal, an oxide film, and a semiconductor structure (MOS structure) with the silicon carbide single crystal as a substrate. SOLUTION: Oxygen flows inside a reaction tube that is heated at a high temperature, hydrogen is discharged from a narrow nozzle in the inside for generating plasma flame, the surface of a silicon carbide single crystal is oxidized in a water vapor atmosphere that is generated by the plasma flame and exceeds 1200°C, and a high-quality oxide film having less residual carbon atoms is fabricated on the surface. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003179048(A) 申请公布日期 2003.06.27
申请号 JP20010375390 申请日期 2001.12.10
申请人 JAPAN ATOM ENERGY RES INST 发明人 YOSHIKAWA MASATO;ITO HISAYOSHI;OSHIMA TAKESHI
分类号 H01L21/316;H01L21/31;(IPC1-7):H01L21/316 主分类号 H01L21/316
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