发明名称 MICROSCOPE HAVING HIGH-CONTRAST IMAGE IMAGING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a microscope which can rapidly take a general view (overall picture) of an image or scan the image with high resolution advantageously in terms of a cost while selectively making such taking or scanning of the image possible. SOLUTION: The microscope has an illuminator and a secondary image sensor for electronically detecting the microscope image of a sample to be examined on a support for the sample to be examined, in which the illuminator has a diaphragm (2) selectively arrangeable in an optical path; a scanning unit for position adjustment for moving the sample (3) to be examined or the support for the sample to be examined or further the diaphragm (2) for scanning in some cases within the optical path so as to scan the inspection region of the sample (3) by a light beam progressing through the diaphragm (2) is provided; and a memory device (4) to store image information during the scanning and to enable the call of the image information after the scanning is provided. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003177324(A) 申请公布日期 2003.06.27
申请号 JP20020285603 申请日期 2002.09.30
申请人 LEICA MICROSYSTEMS WETZLAR GMBH 发明人 BLOEDORN JOCHEN;RUEHL HELMUT
分类号 G02B21/00;G02B21/06;G02B21/36;H04N5/225;(IPC1-7):G02B21/00 主分类号 G02B21/00
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