发明名称 |
METHOD FOR FORMING CONTACT HOLE |
摘要 |
PURPOSE: A method for forming a contact hole is provided to be capable of preventing the misalignment between a contact hole and a gate, and the contact hole and an isolation layer by forming a dummy pattern on the isolation layer while forming a gate. CONSTITUTION: An isolation layer(202) is formed in a semiconductor substrate(200). A polycrystalline silicon layer and the first silicon nitride layer are sequentially formed on the semiconductor substrate. A gate(a) and a dummy pattern(b) are simultaneously formed on the predetermined portions of the semiconductor substrate by selectively etching the first silicon nitride layer and polycrystalline silicon layer using a photolithography process. An insulating spacer(209) is formed at both sidewalls of the gate and dummy pattern. After depositing an insulating layer(210) on the resultant structure, a contact hole(211) is formed by selectively etching the insulating layer.
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申请公布号 |
KR20030052654(A) |
申请公布日期 |
2003.06.27 |
申请号 |
KR20010082677 |
申请日期 |
2001.12.21 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, JEONG UNG;LIM, TAE JEONG;PARK, GYE SUN;SEO, IL SEOK |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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