发明名称 METHOD FOR FORMING CONTACT HOLE
摘要 PURPOSE: A method for forming a contact hole is provided to be capable of preventing the misalignment between a contact hole and a gate, and the contact hole and an isolation layer by forming a dummy pattern on the isolation layer while forming a gate. CONSTITUTION: An isolation layer(202) is formed in a semiconductor substrate(200). A polycrystalline silicon layer and the first silicon nitride layer are sequentially formed on the semiconductor substrate. A gate(a) and a dummy pattern(b) are simultaneously formed on the predetermined portions of the semiconductor substrate by selectively etching the first silicon nitride layer and polycrystalline silicon layer using a photolithography process. An insulating spacer(209) is formed at both sidewalls of the gate and dummy pattern. After depositing an insulating layer(210) on the resultant structure, a contact hole(211) is formed by selectively etching the insulating layer.
申请公布号 KR20030052654(A) 申请公布日期 2003.06.27
申请号 KR20010082677 申请日期 2001.12.21
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JEONG UNG;LIM, TAE JEONG;PARK, GYE SUN;SEO, IL SEOK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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