| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for performing a test to be conducted on an IC with the possibility of resetting one of scan architectures and with a high degree of accuracy and failure detection range and in the shortest time. SOLUTION: With respect to the method for setting an integrated circuit (200), which is provided with several integrated circuit input/output pins having specified maximum input/output frequency and several scan chains (208) which are electrically conductive with the input/output pins for a test, the scan chains have the specified maximum latching frequency and the integrated circuit is connected to an integrated circuit testing device via a usable number of pins of the several integrated circuit input/output pins. The method includes a step for setting the time for testing the integrated circuit to the shortest when the latch frequency is lower than the specified maximum input/output frequency and the number of available integrated circuit input/output pins is smaller than that, which is required by the presented scan architecture (202). COPYRIGHT: (C)2003,JPO
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