| 摘要 |
FIELD: spectral analysis. SUBSTANCE: method comprises steps of registering system of interference bands of standing light wave in the form of spatial frequency signal by projecting image of interference band system to periodical system having photodetectors arranged by two shifted mutually parallel rows or at shifting image of bands relative to photodetectors; writing received electric signals in the form of their dependence upon position of photodetectors in periodic system and analyzing them. Interferometers for realizing the method includes optically matched light irradiation source, reflecting mirror, spectrum analyzer, thin layer, periodic system with photodetectors and screen. Thin layer and reflecting mirror may be made with possibility of shifting relative to screen and periodic system having photodetectors in direction of alternating interference bands. Said periodic system may be in the form of two shifted by period half parallel rows of photodetectors. Accuracy of measuring light waves is increased by 2 - 5 times. EFFECT: enhanced accuracy of measuring light waves. 6 cl, 2 dwg |
