发明名称 DELAY LOCKED LOOP CIRCUIT FOR IMPROVING JITTER CHARACTERISTIC
摘要 PURPOSE: A delay locked loop circuit for improving a jitter characteristic is provided to improve the final jitter characteristic and a maximum phase error by using two phase detection circuits and two delay circuits. CONSTITUTION: A delay locked loop circuit includes a delay circuit(605,607), a phase detection block(601,603), and a delay control circuit. The delay circuit receives an input clock signal and a delayed output clock signal. The phase detection block receives the input clock signal and the output clock signal of the delay circuit. The phase detection block generates a phase pull signal when a phase of the input clock signal delayed as much as one hour precedes a phase of the output clock signal or a phase push signal when the phase of the input clock signal delayed as much as two hours does not precede the phase of the output clock signal. A delay control circuit generates a delay control circuit according to the phase pull signal or the phase push signal.
申请公布号 KR20030052652(A) 申请公布日期 2003.06.27
申请号 KR20010082675 申请日期 2001.12.21
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SEONG HUN
分类号 G06F1/10;H03K5/135;H03L7/081;H03L7/089;(IPC1-7):H03L7/00 主分类号 G06F1/10
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