发明名称 METHOD AND SYSTEM FOR FORMING GATE ELECTRODE HAVING TWO WORK FUNCTIONS IN SEMICONDUCTOR GATE
摘要 PROBLEM TO BE SOLVED: To give two work functions upon forming a gate electrode, in a semiconductor gate and to require adjustment of the value of one of the work functions. SOLUTION: In a semiconductor device of a structure including a substrate, a dielectric layer, a metal layer, a silicon-germanium layer, a first part of the silicon-germanium layer is removed to expose a first part of a metal layer, and a second part of the silicon-germanium layer is left behind on a second part of the metal layer. A first gate electrode including the first part of the metal layer and a second gate electrode including a silicon-germanium metal composition formed with a second part of the silicon-germanium layer and the second part of the metal layer are formed. It is possible to give two work functions to a gate electrode by adjusting the latter work function. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003179155(A) 申请公布日期 2003.06.27
申请号 JP20020282478 申请日期 2002.09.27
申请人 TEXAS INSTRUMENTS INC 发明人 ROTONDARO ANTONIO L P;VISOKAY MARK R
分类号 H01L21/28;H01L21/8234;H01L21/8238;H01L27/088;H01L29/423;H01L29/49;H01L29/51;(IPC1-7):H01L21/823 主分类号 H01L21/28
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