发明名称 Wafer mapping system
摘要 A wafer mapping system according to the present invention is provided with an access port for transferring in and out a wafer, and performs a detection operation of an accommodated wafer to a cassette in which slots for accommodating and holding substantially level a plurality of inserted wafers are disposed in a plurality of tiers. The wafer mapping system comprises: a receiver that is fixed to a member facing the access port and formed of receiving elements arranged serially along a height direction of the cassette; and a transmitter that is disposed movable in a up and down direction of the cassette and transmits a signal toward a wafer accommodated in each of the slots of the cassette; wherein the receiver receives a signal transmitted from the transmitter, and thereby presence or absence and a state of a wafer accommodated in each of the slots of the cassette are detected. Thereby, with a simple system configuration, an accommodation state of the wafer in a FOUP can be accurately detected.
申请公布号 US2003119214(A1) 申请公布日期 2003.06.26
申请号 US20020316120 申请日期 2002.12.11
申请人 SHINKO ELECTRIC CO., LTD. 发明人 KITAZAWA YASUYOSHI;SUZUKI SHIGETO;MIKI TOSHIO;NAKAGAWA SUSUMU;YASUDA KATSUMI;KITAJI KAZUNARI
分类号 H01L21/68;H01L21/00;(IPC1-7):H01L21/00 主分类号 H01L21/68
代理机构 代理人
主权项
地址