发明名称 |
SPECTRUM MEASURING INSTRUMENT |
摘要 |
In a spectrum measuring instrument of the present invention, a detecting surface (13a) of a detector (13) is a two-dimensional detecting surface and spectrum light coming out from a spectroscope is irradiated to a region A on the detecting surface (13a). Signal intensity at the regions on the detecting surface (13a) other than the region A where the spectrum light is irradiated is subtracted from signal intensity on the region A. Consequently, it is possible to obtain an accurate spectrum intensity signal by processing a detection signal in such a manner that adverse effects of stray light generated inside the spectrum measuring instrument and unwanted light generated by reflection and diffraction occurring on the surface of a detecting element are removed (Fig. 4). |
申请公布号 |
WO0198740(A3) |
申请公布日期 |
2003.06.26 |
申请号 |
WO2001JP05199 |
申请日期 |
2001.06.19 |
申请人 |
OTSUKA ELECTRONICS CO., LTD.;OKA, KOUICHI;OKAWAUCHI, MAKOTO |
发明人 |
OKA, KOUICHI;OKAWAUCHI, MAKOTO |
分类号 |
G01J3/36;G01J3/18;G01J3/28 |
主分类号 |
G01J3/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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