发明名称 Method for self-calibrated sub-aperture stitching for surface figure measurement
摘要 A method for accurately synthesizing a full-aperture data map from a series of overlapped sub-aperture data maps. In addition to conventional alignment uncertainties, a generalized compensation framework corrects a variety of errors, including compensators that are independent in each sub-aperture. Another class of compensators (interlocked) include coefficients that are the same across all the sub-apertures. A constrained least-squares optimization routine maximizes data consistency in sub-aperture overlap regions. The stitching algorithm includes constraints representative of the accuracies of the hardware to ensure that the results are within meaningful bounds. The constraints also enable the computation of estimates of uncertainties in the final results. The method therefore automatically calibrates the system, provides a full-aperture surface map, and an estimate of residual uncertainties. Therefore, larger surfaces can be tested with greater departures from a best-fit sphere to greater accuracy than was possible in the prior art.
申请公布号 US2003117632(A1) 申请公布日期 2003.06.26
申请号 US20020303236 申请日期 2002.11.25
申请人 QED TECHNOLOGIES INC. 发明人 GOLINI DONALD;FORBES GREG;MURPHY PAUL
分类号 G01B11/24;G01B9/02;G01B11/255;G01J9/00;G01M11/00;G01M11/02;G01N21/84;(IPC1-7):G01B11/02 主分类号 G01B11/24
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