发明名称 IMPROVED HARTMANN-SHACK WAVEFRONT SENSOR APPARATUS AND METHOD
摘要 <p>An apparatus, system, and method related to improving the wavefront aberration measurement of an optical system such as an eye made with a Hartmann-Shack aberrometer relies on selectively obscuring the transmission of wavefront light propagating to or from individual lenslets of the microlens array of the aberrometer to be imaged onto a detector. A LCD is disclosed as a preferable light transmission generator/modulator. Obscuration patterns can be controlled spatially, temporally, or in combination. An improved image forming component of the aberrometer is disclosed, as well as an improved aberrometer, method of measuring, and a system for making a corrective optical surface.</p>
申请公布号 WO2003051189(A2) 申请公布日期 2003.06.26
申请号 EP2002014257 申请日期 2002.12.13
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