发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR TRANSISTOR |
摘要 |
PURPOSE: A method for fabricating a semiconductor transistor is provided to prevent stress of a semiconductor substrate in a spacer formation process, and to make the impurities implanted into the semiconductor substrate not diffused to the outside by omitting a process for forming a spacer on a side of a gate electrode. CONSTITUTION: The gate electrode(34) of a reverse trapezoid type is formed on a semiconductor substrate(30). Impurity ions are implanted into the semiconductor substrate at a predetermined angle by using the gate electrode as a mask so that a low density source/drain region(36a,36b) is formed on a side of the gate electrode. Impurity ions are implanted into the low density source/drain region in a direction perpendicular to the gate electrode by using the gate electrode as a mask so that a high density source/drain region(38a,38b) is formed in the low density source/drain region.
|
申请公布号 |
KR20030048949(A) |
申请公布日期 |
2003.06.25 |
申请号 |
KR20010079004 |
申请日期 |
2001.12.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JUN HA |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|