| 摘要 |
PURPOSE: A thin film transistor substrate having a visual inspector and a visual inspection method are provided to carry out visual inspection on the thin film transistor substrate on which drive ICs are integrated. CONSTITUTION: A thin film transistor substrate includes an insulating substrate(10) having a display area(150) and a periphery area, a plurality of gate lines(GL1-GLn) formed on the substrate, a plurality of data lines(DL1-DLm) formed on the substrate, intersecting the gate lines to define the display area, a gate driving circuit(170) formed in the periphery and connected to the gate lines, and a VI logic circuit(180) that is inserted between the gate driving circuit and the gate lines and has the first, second and third NOR gates. The first input port of the first NOR gate is connected to the output port of the gate driving circuit and the second input port is connected to a CON1 port. The output port of the first NOR gate is connected to the first input port of the second or third NOR gate. The second input port of the second NOR gate is coupled to a CON2 port and the output port is connected to odd-numbered gate lines. The second input port of the third NOR gate is coupled to a CON3 port and the output port is connected to even-numbered gate lines.
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