发明名称 |
METHOD FOR FABRICATING ISOLATION LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating an isolation layer of a semiconductor device is provided to improve yield and productivity simultaneously by improving an insulation characteristic of the isolation layer, a step coverage and a filling characteristic. CONSTITUTION: A pad insulation layer(M) is formed on a substrate(20). The substrate is selectively etched to form a trench by using the pad insulation layer as an etch mask. A fluid insulation layer(23) is formed along the profile of the trench by using reaction source including nitrogen. A densifying insulation layer(24) is formed on the fluid insulation layer to fill the trench. A planarization process is performed on the densifying insulation layer and the fluid insulation layer until the surface of the pad insulation layer is exposed, so that the densifying insulation layer and the fluid insulation layer constitute the isolation layer(ISO) of a stacked structure in the trench.
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申请公布号 |
KR20030049842(A) |
申请公布日期 |
2003.06.25 |
申请号 |
KR20010080165 |
申请日期 |
2001.12.17 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
AHN, SANG TAE;KIM, CHUN HWAN |
分类号 |
H01L21/762;(IPC1-7):H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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