发明名称 |
METHOD FOR FABRICATING THIN FILM TRANSISTOR USING POLYCRYSTALLINE SILICON |
摘要 |
PURPOSE: A method for fabricating a thin film transistor using polycrystalline silicon is provided to uniformly apply a photoresist layer by crystallizing an amorphous silicon layer and by planarizing the crystallized silicon layer through an etch process using a plasma process. CONSTITUTION: The amorphous silicon layer is formed on an insulated substrate. Laser is irradiated to the amorphous silicon layer and the amorphous silicon layer is crystallized through a lateral solidification process to form a crystalline silicon layer. The crystalline silicon layer is planarized through an etch process using plasma. The crystalline silicon layer is patterned to form a semiconductor layer. The semiconductor layer is covered with a gate insulation layer. A gate electrode is formed on the gate insulation layer of the semiconductor layer. Impurity ions are implanted into the semiconductor layer to form source and drain regions at both sides of the gate electrode. Source and drain electrodes are electrically connected to the source and drain regions, respectively.
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申请公布号 |
KR20030049764(A) |
申请公布日期 |
2003.06.25 |
申请号 |
KR20010080074 |
申请日期 |
2001.12.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, BEOM RAK;CHOI, JUN HU;KANG, MYEONG GU;KANG, SUK YEONG;SONG, JIN HO |
分类号 |
G02F1/1368;H01L21/20;H01L21/208;H01L21/3065;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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