发明名称 |
ELECTROSTATIC DISCHARGE PROTECTION TRANSISTOR |
摘要 |
PURPOSE: An electrostatic discharge protection transistor is provided to improve an electrical characteristic by forming a uniform current path when charges are generated by an outside high voltage so that a contact melting phenomenon caused by a charge crowding phenomenon is prevented. CONSTITUTION: A drain junction part(22) of a circular type is formed to be connected to a pad part(26). A drain junction part contact(24) of a circular type is formed in the drain junction part. An isolation layer(21) of a circular ring type is formed along the periphery of the drain junction part. A source junction part(23) of a circular ring type is formed along the periphery of the isolation layer, connected to a supply voltage/ground voltage(27). A source junction part contact(25) of a circular line type is formed in the source junction part.
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申请公布号 |
KR20030050195(A) |
申请公布日期 |
2003.06.25 |
申请号 |
KR20010080595 |
申请日期 |
2001.12.18 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JUN, YU NAM;KIM, GI SEOK;LEE, GEUN U;SIM, GEUN SU |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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