Automatic test equipment for semiconductor device,申请号EP20020013298-传众专利搜索

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发明名称	Automatic test equipment for semiconductor device
摘要
申请公布号	EP1260822(A3)	申请公布日期	2003.06.25
申请号	EP20020013298	申请日期	1998.07.22
申请人	TERADYNE, INC.	发明人	SARTSCHEV, RONALD A.;MEUTHING, GERALD F., JR.
分类号	G01R31/28;G01R31/3183;G01R31/319;H03K5/00;H03K5/13;H03L7/081;(IPC1-7):G01R31/319	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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