发明名称 METHOD FOR MANUFACTURING CAPACITOR IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a capacitor in a semiconductor device is provided to be capable of improving the capacitance by using a PE(Plasma Enhanced)-oxide layer having low step coverage. CONSTITUTION: After forming the first interlayer dielectric(215) having a plug(210) on a substrate(200), a barrier layer(225) and a PE-oxide layer(230) are sequentially formed on the resultant structure. After cleaning the resultant structure, the first doped poly and the second interlayer dielectric(245) are sequentially formed. By dry etching of the second interlayer dielectric and the first doped poly, a lower electrode(255) is formed. A sidewall electrode(260) made of the second doped poly is formed at both sidewalls of the lower electrode and the second interlayer dielectric. The second interlayer dielectric(245) and the PE-oxide layer(230) are removed. After growing an MPS(Metastable Poly-Silicon) layer on the lower electrode and the sidewall electrode, an upper electrode is then formed.
申请公布号 KR20030049556(A) 申请公布日期 2003.06.25
申请号 KR20010079784 申请日期 2001.12.15
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, WON GYU
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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