发明名称 |
METHOD AND APPARATUS FOR SEMICONDUCTOR WIRING FORMATION, METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND WAFER |
摘要 |
PURPOSE: To provide a method and apparatus for semiconductor wiring formation, a method and apparatus for semiconductor device manufacturing, and a wafer which can omit a thermosetting process and a surface smoothing process, reduce the thickness of a barrier layer, and form wires in a groove with a high aspect ratio under optimum conditions. CONSTITUTION: A vacuum chamber 2 whose inside can be held in a substantially vacuum state is used and the wafer 201 where a semiconductor wiring film is formed is held by a base material holder 3 arranged in the vacuum chamber 2; and the material of the semiconductor wiring film is vaporized by a vapor source 4 arranged in the vacuum chamber 2 and a high-frequency power source 10 supplies high-frequency electric power for generating a plasma 301 in the vacuum chamber 2 by using the base material holder 3 as one electrode.
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申请公布号 |
KR20030051352(A) |
申请公布日期 |
2003.06.25 |
申请号 |
KR20020080513 |
申请日期 |
2002.12.16 |
申请人 |
NISSEI ELECTRONICS, LTD.;SHINMAYWA INDUSTRIES, LTD.;TSUKUBA SEMI TECHNOLOGY |
发明人 |
MARUNAKA MASAO;DOI TOSHIYA;NOSE KOUICHI;TAKIGAWA SHIROU;OTAKE KIYOSHI |
分类号 |
C23C14/24;C23C14/32;C23C14/54;H01J37/32;H01L21/02;H01L21/28;H01L21/285;H01L21/3205;H01L21/768;(IPC1-7):H01L21/28 |
主分类号 |
C23C14/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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