发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND ITS FABRICATING METHOD
摘要 PURPOSE: To provide a high performance, deep submicron double gate type SOIMOS, and its fabricating method, in which impurities are redistributed heavily on a buried gate insulation film interface, double gates are self-aligned and, at the same time, buried gate electrodes are electrically isolated completely from each other. CONSTITUTION: A multilayer SOI substrate having an amorphous or polycrystal semiconductor layer formed beneath an SOI layer through a gate insulation film is employed, the semiconductor layer is implanted with ions in a pattern reverse to that of an upper gate electrode, and a buried gate is formed in self- alignment with the upper gate.
申请公布号 KR20030051212(A) 申请公布日期 2003.06.25
申请号 KR20020068337 申请日期 2002.11.06
申请人 HITACHI ULSI SYSTEMS CO., LTD.;KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.) 发明人 HORIUCHI MASATADA;TAKAHAMA TAKASHI
分类号 H01L29/43;H01L21/336;H01L21/8238;H01L21/84;H01L27/08;H01L27/092;H01L27/12;H01L29/423;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L29/78 主分类号 H01L29/43
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