发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND ITS FABRICATING METHOD |
摘要 |
PURPOSE: To provide a high performance, deep submicron double gate type SOIMOS, and its fabricating method, in which impurities are redistributed heavily on a buried gate insulation film interface, double gates are self-aligned and, at the same time, buried gate electrodes are electrically isolated completely from each other. CONSTITUTION: A multilayer SOI substrate having an amorphous or polycrystal semiconductor layer formed beneath an SOI layer through a gate insulation film is employed, the semiconductor layer is implanted with ions in a pattern reverse to that of an upper gate electrode, and a buried gate is formed in self- alignment with the upper gate.
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申请公布号 |
KR20030051212(A) |
申请公布日期 |
2003.06.25 |
申请号 |
KR20020068337 |
申请日期 |
2002.11.06 |
申请人 |
HITACHI ULSI SYSTEMS CO., LTD.;KABUSHIKI KAISHA HITACHI SEISAKUSHO(D/B/A HITACHI, LTD.) |
发明人 |
HORIUCHI MASATADA;TAKAHAMA TAKASHI |
分类号 |
H01L29/43;H01L21/336;H01L21/8238;H01L21/84;H01L27/08;H01L27/092;H01L27/12;H01L29/423;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/43 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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