发明名称 Multiple wavelength photolithography for preparing multilayer microstructures
摘要 The invention relates to a multilayer microstructure and a method for preparing thereof. The method involves first applying a first photodefinable composition having a first exposure wavelength on a substrate to form a first polymeric layer. A portion of the first photodefinable composition is then exposed to electromagnetic radiation of the first exposure wavelength to form a first pattern in the first polymeric layer. After exposing the first polymeric layer, a second photodefinable composition having a second exposure wavelength is applied on the first polymeric layer to form a second polymeric layer. A portion of the second photodefinable composition is then exposed to electromagnetic radiation of the second exposure wavelength to form a second pattern in the second polymeric layer. In addition, a portion of each layer is removed according to the patterns to form a multilayer microstructure having a cavity having a shape that corresponds to the portions removed.
申请公布号 US6582890(B2) 申请公布日期 2003.06.24
申请号 US20010799744 申请日期 2001.03.05
申请人 SANDIA CORPORATION 发明人 DENTINGER PAUL MICHAEL;KRAFCIK KAREN LEE
分类号 B81C99/00;C25D1/00;G03F7/00;G03F7/095;(IPC1-7):G03C5/58;C25D1/10 主分类号 B81C99/00
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