发明名称 X-ray mapping analysis method
摘要 In order to acquire typical X-ray spectra by dividing automatically dividing contained matter and regions where the density thereof differs into groups in X-ray mapping analysis, measurement starts with the spectra database empty, a designated location within the sample is irradiated with a primary beam by the primary beam control means, the sample is irradiated with the primary beam for a fixed period of time in order to acquire a measurement spectrum, the X-ray spectrum obtained through measurement and X-ray spectra in the spectra database are compared by the X-ray comparison means, the X-ray spectrum obtained through measurement is added to the database when no matching X-ray spectra exists in the database, and measurement is repeated at a designated measurement point.
申请公布号 US6584169(B2) 申请公布日期 2003.06.24
申请号 US20020153508 申请日期 2002.05.22
申请人 SEIKO INSTRUMENTS INC. 发明人 HASEGAWA KIYOSHI
分类号 G01N23/223;G01T1/36;(IPC1-7):G01N23/223 主分类号 G01N23/223
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