发明名称 Method and apparatus for cutting a semiconductor wafer
摘要 A method for cutting a semiconductor wafer is provided. A mount tape is adhered to a back surface of the semiconductor wafer. The mount tape comprises a resin base and a mesh-like member made of a material harder than that of the resin base and embedded in the resin base. A beam-like liquid jet is ejected toward a front surface of the semiconductor wafer and, simultaneously, a laser beam is transmitted axially through said beam-like liquid jet, so that the semiconductor wafer is cut into individual pieces, by said laser beam, together with the resin base of the mount tape, while the mesh-like member is not cut, but remains in its connected state.
申请公布号 US6583383(B2) 申请公布日期 2003.06.24
申请号 US20010847193 申请日期 2001.05.02
申请人 SHINKO ELECTRIC INDUSTRIES CO., LTD. 发明人 HIGASHI MITSUTOSHI;SAKAGUCHI HIDEAKI
分类号 B23K26/00;B23K26/14;B23K26/18;B23K26/40;B23K101/40;H01L21/301;H01L21/78;(IPC1-7):B23K26/00 主分类号 B23K26/00
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