发明名称 Method of manufacturing a semiconductor device
摘要 On a substrate, a gate insulating film, a polysilicon film on the gate insulating film, and a resist pattern on the polysilicon film are formed. Subsequently an exposed portion of the polysilicon film which is not covered with the resist pattern is removed. The surface of the polysilicon film left after the step of removing the exposed portion of the polysilicon film is thermally oxidized to form a gate electrode and an insulating film simultaneously on the surface of the gate electrode.
申请公布号 US6583036(B1) 申请公布日期 2003.06.24
申请号 US20020141922 申请日期 2002.05.10
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 HAYAMIZU TAICHI
分类号 H01L21/28;H01L29/423;H01L29/43;H01L29/49;H01L29/78;(IPC1-7):H01L21/320;H01L21/302;H01L21/461;H01L21/476 主分类号 H01L21/28
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