发明名称 Production method for silicon wafer and SOI wafer, and SOI wafer
摘要 There are provided a method for manufacturing a mirror polished wafer with little polishing sag (peripheral sag) by a relatively easy method, a method for manufacturing a bonded wafer having an SOI layer or a bond layer which has no periphery removing region or reduces it, and a bonded wafer thereof.There is prepared a silicon wafer having chamfered portions in which when the chamfering width of the front surface side of the silicon wafer is X1 and the chamfering width of the back surface side thereof is X2, X1<X2, the front surface of the silicon wafer is mirror polished, and the front surface side thereof is chamfered again so that the chamfering width thereof is X3 (X3>X1).
申请公布号 US6583029(B2) 申请公布日期 2003.06.24
申请号 US20010926645 申请日期 2001.11.28
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 ABE TAKAO;TAKEI TOKIO;OKABE KEIICHI;MIYAJIMA HAJIME
分类号 B24B9/00;B24B9/06;H01L21/02;H01L21/304;H01L21/762;H01L27/12;(IPC1-7):H01L21/30;H01L21/46;H01L21/302;H01L21/461 主分类号 B24B9/00
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