| 摘要 |
<P>PROBLEM TO BE SOLVED: To specify a defective spot in the unit of a flip flop circuit in a short time, in failure analysis of a large-scale integrated circuit having many flip flop circuits loaded thereon. <P>SOLUTION: This integrated circuit is equipped with signal comparing circuit 3, 6 for comparing scan-in signals 8, 10 to each internal circuit 2, 5 with scan-out signals 9, 11 respectively, and outputting comparison result signals 12, 13, and a result comparing circuit 7 for comparing comparison result signals 12, 13 from each signal comparing circuit 3, 6, and outputting a result comparison signal 14. The result comparing circuit 7 outputs a result acquired by comparing the comparison result signals 12, 13 outputted from the signal comparing circuits 3, 6 of each flip flop circuit 1, 4 as the result comparison signal 14, and a defectively-operating flip flop circuit is specified from the relation among the result comparison signal 14, the number of rising of a clock and the number of steps of the flip flop circuit. <P>COPYRIGHT: (C)2003,JPO |
