发明名称 Fixed abrasive polishing pad
摘要 Apparatuses and methods are disclosed using a fixed abrasive polishing pad to perform mechanical polishing of a surface. The apparatus includes a polishing pad positioned opposing a wafer support to provide for polishing of a surface of a wafer placed on the support. The polishing pad includes a first member having a first polishing surface formed from an abrasive first material that is structurally degradable during polishing. The polishing pad also includes a second member having a second polishing surface formed from a second material that is less degradable and less abrasive relative to said first material. The first and second polishing surfaces define a polishing face that is brought into contact with the surface to be polished. Preferably, a portion of the second member can be removed from the polishing pad so that the first polishing surface extends beyond the second polishing surface to provide for a fixed amount of abrasion using the first member prior to the second member contacting the surface and substantially reducing or stopping the polishing process.
申请公布号 US2003114088(A1) 申请公布日期 2003.06.19
申请号 US20030352668 申请日期 2003.01.28
申请人 WALKER MICHAEL A.;ROBINSON KARL M. 发明人 WALKER MICHAEL A.;ROBINSON KARL M.
分类号 B24B7/22;B24B37/04;B24D11/00;B24D13/14;(IPC1-7):B24B1/00;B24B7/19 主分类号 B24B7/22
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