发明名称 METHOD OF FORMING CONTACT PLUG IN SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of forming a contact plug in a semiconductor device is provided to improve electrical property of the semiconductor device by preventing P(phosphorus) in a contact plug from being diffused into lateral sides of a silicon substrate. CONSTITUTION: A gate oxide layer(22) and a gate(24) are sequentially formed on a silicon substrate(20), forming a space buffer layer(26) on both side wall of the gate to form a contact hole in order to expose a portion of the silicon substrate between a gate and a gate closest to it. A silicon epitaxial growth layer(30) is selectively formed in the contact hole by using a SEG(Selective Epitaxial Growth) process. A plug ion implantation process is carried out on the silicon epitaxial growth layer, and a contact plug(34) is formed on the silicon epitaxial growth layer in the contact hole.
申请公布号 KR20030048210(A) 申请公布日期 2003.06.19
申请号 KR20010078077 申请日期 2001.12.11
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, BONG SU
分类号 H01L21/283;(IPC1-7):H01L21/283 主分类号 H01L21/283
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