| 摘要 |
<p>The invention relates to an X-ray examination apparatus and a corresponding method. To provide a fast and accurate control of the X-ray dose combining a fast and inaccurate sensor dose signal from an X-ray sensor and a slow and accurate detector dose signal (I) from an X-ray detector taking into account the delay between said two signals, an X-ray examination apparatus is proposed comprising: a) an X-ray source (1) for generating X-rays, b) an X-ray detecting means (2, 6) for detecting X-rays after penetration through an object of interest (3) providing a detector dose signal (I) accurately indicating the X-ray dose, c) an X-ray dose sensing means (5) for measuring the current X-ray dose of the X-rays penetrating the object of interest (3) providing a sensor dose signal (S) indicating the current X-ray dose, d) control means (7 - 13) for controlling said X-ray source (1) by a control signal (C) being adapted for generating said control signal (C) by correcting said sensor dose signal (S), said control means comprising: a storage means for storing a number of values of the last measured sensor dose signal, and a correcting means for generating a correction signal for correcting the sensor dose signal, said correction signal being generated from the current value of said detector dose signal and the stored value of the sensor dose signal measured at essentially the same time as said value of said detector dose signal.</p> |
