发明名称 Differential spr sensor and measuring method using it
摘要 The present invention provides a differential SPR sensor that is capable of independently determining resonance wavelenghts without determining a baseline. A differential SPR sensor is formed with a surface immobilized with a recognition component and a surface not immobilized with the component on a metal film. The sensor comprises a plurality of dielectric films of different film thicknesses formed on the metal film, wherein one of said dielectric films is taken to be a reference surface and at least the other one dielectric film is taken to be a working surface immobilized with the recognition component. Preferably, the sensor is a probe-type SPR sensor, and a working surface and a reference surface are formed on a metal film providing a sensor surface of the probe.
申请公布号 US2003113231(A1) 申请公布日期 2003.06.19
申请号 US20020296194 申请日期 2002.11.21
申请人 KARUBE ISAO;AKIMOTO TAKUO 发明人 KARUBE ISAO;AKIMOTO TAKUO
分类号 G01N33/543;G01N21/27;G01N21/55;H01L31/12;(IPC1-7):G01N21/47 主分类号 G01N33/543
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