发明名称 |
Differential spr sensor and measuring method using it |
摘要 |
The present invention provides a differential SPR sensor that is capable of independently determining resonance wavelenghts without determining a baseline. A differential SPR sensor is formed with a surface immobilized with a recognition component and a surface not immobilized with the component on a metal film. The sensor comprises a plurality of dielectric films of different film thicknesses formed on the metal film, wherein one of said dielectric films is taken to be a reference surface and at least the other one dielectric film is taken to be a working surface immobilized with the recognition component. Preferably, the sensor is a probe-type SPR sensor, and a working surface and a reference surface are formed on a metal film providing a sensor surface of the probe.
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申请公布号 |
US2003113231(A1) |
申请公布日期 |
2003.06.19 |
申请号 |
US20020296194 |
申请日期 |
2002.11.21 |
申请人 |
KARUBE ISAO;AKIMOTO TAKUO |
发明人 |
KARUBE ISAO;AKIMOTO TAKUO |
分类号 |
G01N33/543;G01N21/27;G01N21/55;H01L31/12;(IPC1-7):G01N21/47 |
主分类号 |
G01N33/543 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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