发明名称 |
METHOD FOR DETECTING IMMOBILIZATION OF PROBES AND METHOD FOR DETECTING BINDING DEGREE BETWEEN THE PROBES AND TARGET SAMPLES |
摘要 |
PURPOSE: A method for detecting immobilization of probes and a method for detecting binding degree between the probes and target samples are provided, thereby simultaneously and accurately detecting immobilization of probe DNA and hybridization of probe DNA with target DNA. CONSTITUTION: A method for detecting immobilization of probes comprises the steps of: (1) supplying probes to a biochip with an MOSFET type sensor; (2) combining the probes with the surface of a gate electrode of the MOSFET type sensor; and (3) measuring characteristics of voltage and current passed through the gate electrode. A method for detecting binding degree between probes and target samples comprises the steps of: (1) supplying probes to a biochip with a MOSFET type sensor to combine them with the surface of a gate electrode of the MOSFET type sensor; (2) measuring characteristics of voltage and current passed through the gate electrode; (3) combining target samples with the probes; and (4) measuring characteristics of voltage and current passed through the gate electrode.
|
申请公布号 |
KR20030048178(A) |
申请公布日期 |
2003.06.19 |
申请号 |
KR20010078010 |
申请日期 |
2001.12.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, YUN GYEONG;KIM, SEON HUI;LIM, GEUN BAE;PARK, JIN SEONG |
分类号 |
G01N33/53;(IPC1-7):G01N33/53 |
主分类号 |
G01N33/53 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|