发明名称 Methods and apparatus determining and/or using overshoot control of write current for optimized head write control in assembled disk drives
摘要 The invention includes a testing method which may be applied to at least one writer in a disk drive during the self-test phase to generate write parameters, focused on the Over Shoot Control (OSC) of the write current parameter to improve the reliability of write operations by that writer. The Minimum OSC is used for write operations in normal temperatures. The Optimum OSC is used for a first lower temperature range, preferably between essentially 15° Centigrade and essentially 5° Centigrade. The Maximum OSC is preferred below essentially 5° C. The Minimum OSC should preferably guarantee both an Adjacent Track Write (ATW) criteria, as well as guarantee a Write Induced Instability (WII) criteria. The invention includes the write parameter collection, as well as the disk drive containing the generated write parameter collection. The invention also includes the method of using that write parameter collection to control a writer while writing to tracks belonging to the radial zone collection and program systems implementing the invention's methods.
申请公布号 US2003112541(A1) 申请公布日期 2003.06.19
申请号 US20020294115 申请日期 2002.11.14
申请人 LEE HAE JUNG;LEE SANG;CHO KEUNG YOUN 发明人 LEE HAE JUNG;LEE SANG;CHO KEUNG YOUN
分类号 A45F5/00;A45F5/10;B65G7/12;G11B5/00;G11B5/012;G11B5/02;G11B20/10;G11B20/18;G11B27/36;(IPC1-7):G11B5/02;G11B21/02 主分类号 A45F5/00
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