发明名称 METHOD FOR COPPER CMP USING POLYMERIC COMPLEXING AGENTS
摘要 The invention provides a method of polishing a substrate comprising a metal layer comprising copper. The method comprises the steps of (i) providing a chemical-mechanical polishing system comprising a liquid carrier, a polishing pad, an abrasive, and a negatively charged polymer or copolymer, (ii) contacting the substrate with the polishing system, and (iii) abrading at least a portion of the substrate to polish the metal layer of the substrate. The negatively charged polymer or copolymer comprises one or more monomers selected from sulfonic acids, sulfonates, sulfates, phosphonic acids, phosphonates, and phosphates, has a molecular weight of 20,000 g/mol or more, and coats at least a portion of the abrasive such that the abrasive has a zeta potential value that is lowered upon interaction of the negatively charged polymer or copolymer with the abrasive.
申请公布号 WO03050864(A2) 申请公布日期 2003.06.19
申请号 WO2002US41453 申请日期 2002.12.03
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 SCHROEDER, DAVID, J.;CARTER, PHILLIP;CHAMBERLAIN, JEFFREY, P.;MILLER, KYLE;CHERIAN, ISAAC, K.
分类号 B24B37/00;C09G1/02;C09K3/14;H01L21/304;H01L21/321 主分类号 B24B37/00
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