发明名称 ALIGNMENT INSPECTION DEVICE OF SUBSTRATE COMBINING APPARATUS
摘要 PURPOSE: An alignment inspection device of a substrate combining apparatus is provided to inspect pixels in a liquid crystal display panel without loss of time to improve productivity. CONSTITUTION: An alignment inspection device of a substrate combining apparatus includes a substrate module(56) constructed in a manner that two substrates are attached to each other, at least one first measurement instrument(52a,52b,52c,52d) and at least on second measurement instrument(70). The first measurement instrument is set at one side of the substrate module in order to inspect alignment of alignment keys indicated on the two substrates. The second measurement instrument is placed on the substrate module to move to pixels of the substrate module to inspect alignment of the pixels. The first measurement instrument includes four cameras set at the corners of the substrate module, and the second measurement instrument is a microscope attache to one side of the first measurement instrument.
申请公布号 KR20030046846(A) 申请公布日期 2003.06.18
申请号 KR20010077114 申请日期 2001.12.06
申请人 LG.PHILIPS LCD CO., LTD. 发明人 JANG, HONG SEONG
分类号 G02F1/13;(IPC1-7):G02F1/13 主分类号 G02F1/13
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